Young Yee Kim
Young Yee Kim is a senior psychometrician at AIR who has expertise in advanced psychometrics, such as multidimensional item response theory, as well as educational policy and research. Dr. Kim has extensive technical and practical expertise in issues related to the National Assessment of Educational Progress (NAEP). She is currently leading and managing the NAEP data-product review task and technical review task of the NAEP Technical Documentation of the Web as well as a psychometric research study to evaluate construct comparability between the paper-based assessments and a digital-based assessment commissioned by the National Center for Education Statistics (NCES). Her other major responsibilities include leading multiple small to medium-scale technical support projects, conducting statistical and psychometric analyses, and conducting and leading technical reviews of NAEP publications, including the Nation’s Report Card, to ensure that they meet statistical and psychometric standards.
Dr. Kim has led multiple NAEP research studies, including two statistical and psychometric studies conducted to inform trend decisions in NAEP, “A Multidimensional Item Response Theory Application to Inform Trend Decisions in the National Assessment of Educational Progress” and “The Development of a Method to Determine Framework Content Coverage Variation in NAEP.” She is also the first author of the book chapter, “Testing and Evaluation of English-Language Learners in Higher Education,” in the Handbook on Measurement, Assessment, and Evaluation in Higher Education (2012) and a co-author of the journal article, “Early Childhood Reading Skills and Proficiency in NAEP Eighth-Grade Reading Assessment” (2015) and an NCES special report, “Performance of Fourth-Grade Students in the 2012 NAEP Computer-Based Writing Pilot Assessment” (2015). Dr. Kim holds doctorates in psychometrics and educational policy from the College of Education, Michigan State University.